SiC Mosfet Characterization For Series Parallel Combination in multi-pulse radiography Applications - Université de Pau et des Pays de l'Adour Access content directly
Conference Papers Year : 2022

SiC Mosfet Characterization For Series Parallel Combination in multi-pulse radiography Applications

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hal-03666275 , version 1 (12-05-2022)

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  • HAL Id : hal-03666275 , version 1

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Eric Brune, Jean-Marie Larbaig, Laurent Pecastaing, Thierry Reess, Antoine Silvestre de Ferron, et al.. SiC Mosfet Characterization For Series Parallel Combination in multi-pulse radiography Applications. 49th International Conference on Plasma Science (ICOPS), May 2022, Seattle, Washington, United States. ⟨hal-03666275⟩
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