EPR PIXE Defects Passivation Nuclear resonance profiling NRP Oxidation Aluminium Silicon carbide Thin films SiC Diffusion Aluminum Growth Rutherford backscattering spectrometry RBS 7630Lh NRP Magnetic semiconductors 17O Gallium oxide NRA Measurement Metal-insulator transition Transparent conductive oxide TCO Stable isotopic tracing 13C ADSORPTION DESORPTION HYSTERESIS GaMnAs Evaluation Auger electron spectroscopy AES 8140Ef Multilayer Magnetization curves Acoustic Raman spectroscopy 17Op Adsorption Isotherms Alloys Oxygen deficiency 3C-SiC Epitaxial growth 18O resonance Density functional theory Isotopic Tracing Adsorbed layers 15N Charge exchange 7550Ee 7550Pp Ion beam analysis Annealing HfO2 Channeling Epitaxy Topological insulators 27Alda 6855Jk Zinc oxide Magnetic anisotropy Hysteresis Periodic multilayer Nanoparticles Gold Energy loss 18O Kossel diffraction Nitridation X-ray diffraction Thin film AC susceptibility Topological defects Low energy electron diffraction LEED XPS Photoluminescence Pulsed laser deposition Interface defects Adsorption ALD Al2O3 Acoustic propreties of solid 2H Capillary condensation Silicon Carbide XRD Sputtering Silicon Pb centers Ion implantation RBS 27Aldp 17Opp Silica Nanostructures Nuclear reaction analysis Ferromagnetic resonance Ageing AFM Atomic Layer Deposition ALD Indium oxide 27Ald p&α Nickel